Reliability physics and engineering provides critically important information for designing and building reliable cost effective products the textbook contains numerous example problems with solutions included at the end of each chapter are exercise problems and answers. Dr jw mcpherson is a texas instruments senior fellow emeritus and an ieee fellow he has published approximately 200 papers on reliability physics and engineering written reliability chapters in four books holds 12 patents and was a past general chair of the international reliability physics symposium. Reliability physics and engineering provides critically important information that is needed for designing and building reliable cost effective products key features include materials device degradation degradation kinetics time to failure modeling. Reliability physics and engineering failure time model to the material device degradation of the main line the system summarizes the integrated circuit and electronics machinery typical failure modes such as spare parts and focuses on the physical mechanism of failure proposed a simple and practical time to failure prediction model . The author emphasizes the physics of failure and the development of reliability engineering models for failurethe beginning of the book concentrates on device materials degradation and the
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